Applied Scanning Probe Methods I

Bharat Bhushan

ISBN 10: 3540005277 / ISBN 13: 9783540005278

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2004

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This volume examines the physical and technical foundation for recent progress in appliednear-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Seller Inventory # 9783540005278

Bibliographic Details

• Title: Applied Scanning Probe Methods I
• Publisher: Springer Berlin Heidelberg, Springer Berlin Heidelberg
• Publication Date: 2004
• Language: English
• ISBN 10: 3540005277
• ISBN 13: 9783540005278
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 35D millimeters 241 millimeters width by 160 millimeters height by 35 millimeters depth
• Weight: 1002 grams

About this title

Synopsis

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Language Notes

Text: German