Applied Scanning Probe Methods III: Characterization (NanoScience and Technology).

Bhushan, B. u. H. Fuchs

Published by Springer,, 2006
Condition: Used Hardcover
Save for Later

Sold by Antiquariat Knacke, Berlin, Germany

AbeBooks Seller since January 28, 2015

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

View this seller's items

Used - Hardcover

Price:
US$ 43.33
US$ 14.42 shipping
Ships from Germany to U.S.A.

Quantity: 1 available

Add to basket

Free 30-day returns

Save for Later