Applied Scanning Probe Methods I (NanoScience and Technology)
Sold by Ammareal, Morangis, France
AbeBooks Seller since August 29, 2016
Used - Hardcover
Condition: Used - Near fine
Ships from France to U.S.A.
Quantity: 1 available
Add to basketSold by Ammareal, Morangis, France
AbeBooks Seller since August 29, 2016
Condition: Used - Near fine
Quantity: 1 available
Add to basketAncien livre de bibliothèque avec équipements. Edition 2004. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 2004. Ammareal gives back up to 15% of this item's net price to charity organizations.
Seller Inventory # G-454-668
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
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