Applied Spectroscopy: A Compact Reference for Practitioners

This book delineates practical, tested, general methods for ultraviolet, visible, and infrared spectrometry in clear language for novice users, and serves as a reference resource for advanced spectroscopists. Applied Spectroscopy includes important information and equations which will be referred to regularly. The book emphasizes reflectance and color measurements due to their common usage in todays spectroscopic laboratories, and contains methods for selectinga measurement technique as well as solar and color measurements. Written by experts in the field, this text covers spectrometry of new materials, ceramics, and textiles, and provides an appendix of practical reference data for spectrometry.

• Book topics include: Practical aspects of spectrometers and spectrometry; Sample preparation; Chemometrics and calibration practices; Reflectance measurements; Standard materials measurements
• An emphasis is placed on reflectance and color measurements due to their common usage in today's spectroscopic laboratories
• Methods for selecting a measurement technique are included as well as solar measurements and reference information on sources, detectors, optical fiber and window materials

Jerry Workman, Jr. is Chief Technical Officer and Vice President of Research

& Engineering at Argose Inc., Waltham, MA. In his career, Workman has

focused on molecular and electronic spectroscopy and chemometrics. He has

published over 200 scientific papers, 7 text volumes, and over 20 patents,

patents pending, and trade secrets. He received the B. A. degree in natural

sciences and M. A. degree in biological sciences and genetics from Saint

Mary's University of Minnesota, and the Ph.D. degree in biological chemistry

from Columbia Pacific University. He has completed technical management

certificates from Columbia University and MIT. He is a Fellow of the

American Institute of Chemists, the American Society for Testing and

Materials International, and the Royal Society of Chemistry. In 2002 he was

the recipient of the ASTM International Award of Merit; IBC International

Scientist of the Year; and the Eastern Analytical Symposium Award for

Outstanding Achievements in the Field of Near Infrared Spectroscopy.

Dr. Art Springsteen is a principal scientist and the director of Reflectance Research at Labsphere Inc. in North Sutton, New Hampshire. He has published numerous articles on optical material synthesis and characterization and measurement techniques of reflectance and diffuse transmittance. In addition, he is the author of Reflectance Spectroscopy: A Guide to Reflectance Materials. He received his Ph.D. in Organic Chemistry from West Virginia University.