Applying Software Metrics
Language: English
Published by IEEE Operations Center, 1996
- Softcover
- New

Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
AbeBooks seller since November 22, 2018
Condition: New
US$ 109.56
Quantity: 1 available
Add to basketItem description from seller
pp. 336 1st Edition.
Seller Inventory # 261448131
- Title
- Applying Software Metrics
- Author
- Shari Lawrence Pfleeger Oman Paul
- Publisher
- IEEE Operations Center
- Publication year
- 1996
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0818676450
- ISBN 13
- 9780818676451
The book differs from others on the market by focusing on the application of the metrics rather than the metrics themselves. The author's provide information based on actual experience with successful metrics programs. Each chapter includes a case study focusing on technology transfer and a set of recommended references. The book serves as a guide on the use and application of software metrics in industrial environments. It is specially designed for managers, product supervisors, and quality assurance personnel who want to know how to implement a metrics program.
"Synopsis" may belong to another edition of this title.
About the Author
Paul Oman and Shari Lawrence Pfleeger are the authors of Applying Software Metrics, published by Wiley.
"About the title" may belong to another edition of this title.
Books Puddle
Woodside, NY, U.S.A.
AbeBooks seller since November 22, 2018
Shipping rates within U.S.A.
| Item | 12 to 19 business days | 12 to 14 business days |
|---|---|---|
| First item | US$ 3.99 | US$ 6.99 |
Payment methods
Store description
I mainly carry imported books from South East Asia / South Asia for readers of all Age Groups.
Specialty
South Asian and South East Asian Culture, Religion, Art etcSeller's business information
PLETOS INC
6931 51st Avenue, WOODSIDE
Woodside, NY U.S.A. 11377
Terms of sale
We accept return for those books which are received damaged. Though we take appropriate care in packing to avoid such situation.