Architecture Design for Soft Errors

Mukherjee, Shubu

ISBN 10: 0123695295 / ISBN 13: 9780123695291

Published by Morgan Kaufmann, 2008

About this Item

Seller Inventory # 0123695295-11-34367919

Bibliographic Details

• Title: Architecture Design for Soft Errors
• Publisher: Morgan Kaufmann
• Publication Date: 2008
• Language: English
• ISBN 10: 0123695295
• ISBN 13: 9780123695291
• Binding: hardcover
• Condition: New

About this title

Synopsis

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them.

To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines.

This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture.

• Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors
• Shows readers how to quantify their soft error reliability
• Provides state-of-the-art techniques to protect against soft errors

Review

"Dr. Shubu Mukherjee's book is a welcome surprise: books by architecture leaders in major companies are few and far between. Written from the viewpoint of a working engineer, the book describes sources of soft errors and solutions involving device, logic, and architecture design to reduce the effects of soft errors." --Max Baron, Microprocessor Report, May 27, 2008