Arithmetic Built-In Self-Test for Embedded Systems

Rajski, Janusz,Tyszer, Jerzy

ISBN 10: 0137564384 / ISBN 13: 9780137564385

Published by Prentice Hall, 1997

About this Item

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Bibliographic Details

• Title: Arithmetic Built-In Self-Test for Embedded Systems
• Publisher: Prentice Hall
• Publication Date: 1997
• Language: English
• ISBN 10: 0137564384
• ISBN 13: 9780137564385
• Binding: hardcover
• Condition: Good

About this title

Synopsis

Describes the software-based, built-in, self-testing for systems with embedded processors that engineers are increasingly using as early as possible in the design process to prevent costly prototyping turns. Offers tutorials, schemes to generate tests employing adders and multipliers, an accumulator-based scheme for the parallel compaction of test responses, fault simulation techniques, and applications. Annotation c. by Book News, Inc., Portland, Or.

From the Back Cover

This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students.