Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Language: English

Published by Springer Berlin Heidelberg, 2006

3540284052 / 9783540284055

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.

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Title
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Author
Gerd Kaupp
Publisher
Springer Berlin Heidelberg
Publication year
2006
Condition
New
Binding
Gebunden
Language
English
ISBN 10
3540284052
ISBN 13
9783540284055
Seller catalogs
Mathematik/Naturwissenschaften/Technik/Medizin

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 56.74US$ 56.74
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