Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Gerd Kaupp

ISBN 10: 3642066631 / ISBN 13: 9783642066634

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 2010, 2010

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 308 pp. Englisch.

Seller Inventory # 9783642066634

Bibliographic Details

• Title: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
• Publisher: Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 2010
• Publication Date: 2010
• Language: English
• ISBN 10: 3642066631
• ISBN 13: 9783642066634
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 17D millimeters 235 millimeters width by 155 millimeters height by 17 millimeters depth
• Weight: 470 grams

About this title

Synopsis

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.