Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Language: English
Published by Wiley, 2012
- Hardcover
- New

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- Title
- Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
- Author
- Haugstad, Greg
- Publisher
- Wiley
- Publication year
- 2012
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0470638826
- ISBN 13
- 9780470638828
“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”
"Synopsis" may belong to another edition of this title.
About the Author
GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.
"About the title" may belong to another edition of this title.
California Books
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