Atomic-Scale Analytical Tomography

Simon P. Ringer

ISBN 10: 1107162505 / ISBN 13: 9781107162501

Published by Cambridge University Press, 2022

About this Item

Druck auf Anfrage Neuware - Printed after ordering - A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

Seller Inventory # 9781107162501

Bibliographic Details

• Title: Atomic-Scale Analytical Tomography
• Publisher: Cambridge University Press
• Publication Date: 2022
• Language: English
• ISBN 10: 1107162505
• ISBN 13: 9781107162501
• Binding: Buch
• Condition: Neu
• Dimensions: 250W x 175H x 19D millimeters 250 millimeters width by 175 millimeters height by 19 millimeters depth
• Weight: 640 grams

About this title

Synopsis

A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

About the Authors

Thomas F. Kelly is a pioneer in the field of atomic-scale research. He was a professor of Materials Science and Engineering at the University of Wisconsin-Madison for 18 years prior to founding Imago Scientific Instruments (later acquired by CAMECA) to commercialize his invention, the local electrode atom probe (LEAP). Currently, Dr Kelly is Founder and CEO of Steam Instruments, Inc., is a Fellow of the Microscopy Society of America, the International Field Emission Society, the Microanalysis Society, and the Korean Society for Microscopy. He was recently elected to the US National Academy of Engineering.

Brian P. Gorman is a Professor of Metallurgical and Materials Engineering at the Colorado School of Mines. His group has been developing experimental methods, hardware, and data analysis techniques for correlative electron microscopy and atom probe tomography since 2006.

Simon P. Ringer is an engineer and leading researcher in atomic-scale materials design. A Professor in materials engineering in the School of Aerospace, Mechanical and Mechatronic Engineering, and an academic member and former Director of the Australian Centre for Microscopy & Microanalysis at the University of Sydney, he is presently Director of the Core Research Facilities at the University. He is a Fellow of the Institution of Engineers Australia, and a Fellow of the Australian Academy of Technology and Engineering.