Atomic force microscopy | Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre

Frederic P. Miller (u. a.)

ISBN 10: 6132722157 ISBN 13: 9786132722157
Published by OmniScriptum, 2026
Language: English
Condition: New Soft cover

Sold by preigu, Osnabrück, Germany

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New - Soft cover

Condition: New

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