Automated Technology for Verification and Analysis: 6th International Symposium, Atva 2008, Seoul, Korea, October 20-23, 2008, Proceedings

Cha, Sungdeok (Editor)/ Choi, Jin-Young, Ph.D. (Editor)/ Kim, Moonzoo (Editor)

ISBN 10: 354088386X ISBN 13: 9783540883869
Published by Springer-Verlag New York Inc, 2008
Language: English
Condition: New Soft cover

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