Automating Software Defect Detection Through Machine Learning and LLMs (Paperback)
Language: English
Published by IGI Global, Hershey, PA, 2025
- Softcover
- New

Seller: CitiRetail, Stevenage, United KingdomCitiRetail
AbeBooks seller since June 29, 2022
Condition: New
US$ 245.03
Quantity: 1 available
Add to basketItem description from seller
Paperback. As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning (ML) techniques and large language models (LLMs) emerges as a transformative approach in automating software defect detection. ML algorithms can learn from historical bug data to predict vulnerabilities, while LLMs can detect anomalies with high accuracy. This convergence holds the potential to improve automation, software engineering, and defect detection, while introducing new challenges in interpretability, data bias, and model reliability that require further exploration. Automating Software Defect Detection Through Machine Learning and LLMs explores how cutting-edge technologies like machine learning (ML) and large language models (LLMs) transform software detection. It examines how these technologies enhance accuracy, scalability, and efficiency in identifying and mitigating software defects. This book covers topics such as algorithms, fraud detection, and software engineering, and is a useful resource for engineers, security professionals, academicians, researchers, and computer scientists. "This book provides a comprehensive understanding of how machine learning and large language models revolutionize the process of software defect detection"-- Provided by publisher. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…
Seller Inventory # 9798337344614
- Title
- Automating Software Defect Detection Through Machine Learning and LLMs (Paperback)
- Author
- Bryan Gardiner
- Publisher
- IGI Global, Hershey, PA
- Publication year
- 2025
- Condition
- new
- Binding
- Paperback
- Language
- English
- ISBN 13
- 9798337344614
"Synopsis" may belong to another edition of this title.
CitiRetail
Stevenage, United Kingdom
AbeBooks seller since June 29, 2022
Shipping rates from United Kingdom to U.S.A.
| Item | 7 to 14 business days | 7 to 60 business days |
|---|---|---|
| First item | US$ 49.04 | US$ 49.04 |
Payment methods
Store description
Online business
Seller's business information
ABC BOOKS LIMITED
10 John Street
London, United Kingdom WC1N 2EB
Terms of sale
Orders can be returned within 30 days of receipt.
Shipping terms
Please note that titles are dispatched from our US, Canadian or Australian warehouses. Delivery times specified in shipping terms. Orders ship within 2 business days. Delivery to your door then takes 7-14 days.