Title: Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices
Publisher: Taylor & Francis Ltd
Publication Date: 2024
Language: English
ISBN 10: 0367635887
ISBN 13: 9780367635886
Binding: Paperback / softback
Condition: New
Weight: 748 grams

About this title

Synopsis

Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime.

Describes how to use the developed methods of analytical predictive modeling to minimize thermal stresses and strains in solder joint of IC devices
Shows how to build the preprocessing models in finite-element analyses (FEA) by comparing the FEA and analytical data
Covers how to design the most effective test vehicles for testing solder joints
Details how to design and organize, in addition to or sometimes even instead of highly accelerated life tests (HALT), highly focused and highly cost-effective failure oriented accelerated testing (FOAT) to understand the physic of failure of solder joint interconnections
Outlines how to convert the low cycle fatigue conditions into elastic fatigue conditions and to assess the fatigue lifetime in such cases
Illustrates ways to replace time- and labor-consuming, expensive, and possibly misleading temperature cycling tests with simpler and physically meaningful accelerated tests

This book is aimed towards professionals in electronic and photonic packaging, electronic and optical materials, materials engineering, and mechanical design.

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