Basics of Interferometry, Second Edition

P. Hariharan

ISBN 10: 0123735890 / ISBN 13: 9780123735898

Published by Academic Pr, 2006

About this Item

2nd edition. 226 pages. 8.75x6.00x0.50 inches. In Stock.

Seller Inventory # __0123735890

Bibliographic Details

• Title: Basics of Interferometry, Second Edition
• Publisher: Academic Pr
• Publication Date: 2006
• Language: English
• ISBN 10: 0123735890
• ISBN 13: 9780123735898
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Brand New

About this title

Synopsis

Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.

Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.

• Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems
• Practical details enrich understanding for readers new to this material
• New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)

About the Author

Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA’s Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE’s Dennis Gabor Award and, most recently, SPIE’s highest award, the Gold Medal.