Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Language: English
Published by Springer, 2024
- Softcover
- New

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- Title
- Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
- Author
- Li, Xiaowei; Yan, Guihai; Liu, Cheng
- Publisher
- Springer
- Publication year
- 2024
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 9811985537
- ISBN 13
- 9789811985539
This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
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Biblios
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