Burn-In Testing: Its Quantification and Optimization

Dimitri B. Kececioglu

ISBN 10: 1932078061 / ISBN 13: 9781932078060

Published by DEStech Publications, Inc., 2002

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Bibliographic Details

• Title: Burn-In Testing: Its Quantification and Optimization
• Publisher: DEStech Publications, Inc.
• Publication Date: 2002
• Language: English
• ISBN 10: 1932078061
• ISBN 13: 9781932078060
• Binding: hardcover
• Condition: New
• Book Type: book

About this title

Synopsis

· Definitions, classifications, and test conditions · A review of failure patterns during burn-in · Vividly illustrated with figures, tables and charts · A quick calculation approach for time determination · A roadmap for practical applications -------------------------------------------------------------------------------- Burn-in testing (an alternative to ESS) is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level. This book covers all aspects of burn-in-testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of s

About the Author

DR. DIMITRI KECECIOGLU initiated the Reliability Engineering Program of at The University of Arizona, Tucson, in 1963. Since then, he has consulted internationally with more than 90 businesses and government agencies, and published 14 books and more than 130 articles. He has trained over 10,000 people in the techniques of reliability and quality engineering.
DR. FENG-BIN SUN received his Ph. D. in 1997 from the Department of Aerospace and Mechanical Engineering at The University of Arizona. He is currently a Staff Reliability Engineer in the Corporate Reliability Engineering Department of Quantum Corporation, Milpitas, California. He has authored and co-authored 3 books and 16 papers in reliability, maintainability, and quality engineering.