CMOS RF Circuit Design for Reliability and Variability

Jiann-Shiun Yuan

ISBN 10: 9811008825 / ISBN 13: 9789811008825

Published by Springer, Springer, 2016

About this Item

Druck auf Anfrage Neuware - Printed after ordering - The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Seller Inventory # 9789811008825

Bibliographic Details

• Title: CMOS RF Circuit Design for Reliability and Variability
• Publisher: Springer, Springer
• Publication Date: 2016
• Language: English
• ISBN 10: 9811008825
• ISBN 13: 9789811008825
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 7D millimeters 235 millimeters width by 155 millimeters height by 7 millimeters depth
• Weight: 184 grams

About this title

Synopsis

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.