Characterization and Measurement of Passive and Active Metamaterial Devices

Lundell, Christopher A

ISBN 10: 1249594987 / ISBN 13: 9781249594987

Published by Biblioscholar, 2012

About this Item

Print on Demand pp. 246.

Seller Inventory # 386358452

Bibliographic Details

• Title: Characterization and Measurement of Passive and Active Metamaterial Devices
• Publisher: Biblioscholar
• Publication Date: 2012
• Language: English
• ISBN 10: 1249594987
• ISBN 13: 9781249594987
• Binding: Soft cover
• Condition: New

About this title

Synopsis

This document addresses two major obstacles facing metamaterial development: uncertainty in the characterization of electromagnetic field behavior in metamaterial structures and the relatively small operational bandwidth of metamaterial structures. To address the first obstacle, a new method to characterize electromagnetic field behavior in a metamaterial is presented. This new method is a bistatic radar cross section (RCS) measurement technique. RCS measurements are well-suited to measuring bulk metamaterial samples because they show frequency dependence of scattering angles and offer common postprocessing techniques that can be useful for visualizing results.

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