Characterization of Minerals, Metals, and Materials 2026 | In-Situ Characterization Techniques. This item is unavailable.
Language: English
Published by Springer, 2026
- Hardcover
- New

Condition: New
US$ 271.16
Item description from seller
Characterization of Minerals, Metals, and Materials 2026 | In-Situ Characterization Techniques | Kelvin Yu Xie (u. a.) | Buch | xxii | Englisch | 2026 | Springer | EAN 9783032135995 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Seller Inventory # 134700048
- Title
- Characterization of Minerals, Metals, and Materials 2026 | In-Situ Characterization Techniques
- Author
- Kelvin Yu Xie (u. a.)
- Publisher
- Springer
- Publication year
- 2026
- Condition
- Neu
- Binding
- Buch
- Language
- English
- ISBN 10
- 3032135990
- ISBN 13
- 9783032135995
- Item weight
- 742 grams
- Dimensions
- 241 x 160 x 23 mm
- Seller catalogs
- Bücher
The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to:
- Extraction and processing of various types of minerals, process–structure– property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materials
- Novel methods and techniques for characterizing materials across a spectrum of systems and processes
- Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materials
- Characterization of structural, morphological, and topographical natures of materials at micro- and nano-scales
- Characterization of extraction and processing including process development and analysis
- Advances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques
- 2D and 3D modeling for materials characterization
"Synopsis" may belong to another edition of this title.
About the Author
Kelvin Yu Xie, Texas A&M University, College Station, TX; Zhiwei Peng, Central South University, Changsha, China; Mingming Zhang, Baowu Ouyeel Co. Ltd., Schererville, IN; Jian Li, CanmetMATERIALS, Hamilton, ON, Canada; Bowen Li, Michigan Technological University, Houghton, MI; Sergio Neves Monteiro, Military Institute of Engineering, Rio de Janeiro, Brazil; Rajiv Soman, AnalytiChem Group, West Chester, OH; Jiann-Yang Hwang, Michigan Technological University, Houghton, MI; Yunus Eren Kalay, Middle East Technical University, Ankara, Turkey; Juan P. Escobedo-Diaz, University of New South Wales, Canberra, ACT, Australia; John S. Carpenter, Los Alamos National Laboratory, Los Alamos, NM; Shadia Ikhmayies, University of Jordan, Amman, Jordan; Eason Chen, Nanyang Technological University, Singapore
"About the title" may belong to another edition of this title.