Characterization in Silicon Processing. This item is unavailable.
Language: English
Published by Momentum Press, 2010
- Hardcover
- New
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Hardcover
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Item description from seller
pp. 240.
Seller Inventory # 262564193
- Title
- Characterization in Silicon Processing
- Author
- Yale E. Strausser
- Publisher
- Momentum Press
- Publication year
- 2010
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 1606501097
- ISBN 13
- 9781606501092
With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and ass
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About the Author
Yale E. Strausser
"About the title" may belong to another edition of this title.