Characterization of Smart PZT and Admittance Signatures for SHM | PZT for Structural Health Monitoring

Venu Gopal Madhav Annamdas

ISBN 10: 3845417528 / ISBN 13: 9783845417523

Published by LAP LAMBERT Academic Publishing, 2011

About this Item

Characterization of Smart PZT and Admittance Signatures for SHM | PZT for Structural Health Monitoring | Venu Gopal Madhav Annamdas | Taschenbuch | 260 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783845417523 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Seller Inventory # 106895173

Bibliographic Details

• Title: Characterization of Smart PZT and Admittance Signatures for SHM | PZT for Structural Health Monitoring
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2011
• Language: English
• ISBN 10: 3845417528
• ISBN 13: 9783845417523
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 17D millimeters 220 millimeters width by 150 millimeters height by 17 millimeters depth
• Weight: 405 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

Engineering structures can be classified into two categories based on their stiffness, those which are more stiff than and those which are less stiff than the PZT material. Surface bonded PZT transducers are more efficient when they are stiffer than the host structure, and embedded transducers are more efficient when they are less stiff than the host structure. Both types of PZT transducers are important in the EMI based NDE of the two categories of engineering structures. However, surface bonded PZT transducers have seen more prominent applications in the recent past in SHM. This research developed both surface bonded and embedded PZT- structure interaction models for SHM of existing and future ACM structures. Furthermore PZT material properties are easily influenced by external factors such as the atmosphere and the presence of electric and magnetic fields. Hence, this research made a step by step analysis to understand the PZT properties prior to their usage in the interaction models. Thus, this book presented the characterization of the PZT properties. Last but not least, this research also studied the influencing factors of EM admittance Signatures.

About the Author

Dr. Venu Gopal Madhav Annamdas obtained his PhD(2007) from Nanyang Technological University (NTU) Singapore. M.E (2001) from Indian Institute of Science,(IISc)Bangalore and B.E (1998)from Osmania University, Hyderabad. He did his Post Doc in NTU (2006-08) and University of Pittsburgh (2008-09). He is presently a Visiting Scientist in NTU, Singapore