Characterization of materials Pt. 1 : Materials Science and Technology :

Cahn, R.W., P. Haasen and E.J. Kramer:

ISBN 10: 3527268154 / ISBN 13: 9783527268153

Published by Weinheim, VCH, 1992

About this Item

724 Seiten : mit Abbildungen : Ausgesondertes Bibliotheksexemplar mit den zugehörigen Kennzeichnungen, Klebespuren von Bibliotheksaufkleber auf Buchrücken, Stempel auf Titelseite, Aufkleber, Stempel und RFID-Chip im Nachsatz, ansonsten in sehr gutem Zustand und nur sehr leicht lager- und gebrauchsspurig DE-100-01 Sprache: Englisch Gewicht in Gramm: 1458.

Seller Inventory # 1887049

Bibliographic Details

• Title: Characterization of materials Pt. 1 : Materials Science and Technology :
• Publisher: Weinheim, VCH
• Publication Date: 1992
• Language: English
• ISBN 10: 3527268154
• ISBN 13: 9783527268153
• Binding: Gr.-8°, gebundene Ausgabe
• Edition: Volume 2A.
• Condition: Sehr gut
• Weight: 1458 grams
• Seller catalogs:
  • Technik

About this title

Synopsis

The first book of a two-part volume dealing with the methods of characterizing metals, ceramics, polymers and related materials.

From the Contents:
Amelinckx: Electron Diffraction and Transmission Electron Microscopy. Hall: Analytical Electron Microscopy. Joy: Scanning Electron Microscopy. Snyder: X-Ray Diffraction. Telle/Petzow: Light Optical Microscopy. Keliher/Skelly Frame: Atomic Spectrometry. Gallagher: Thermoanalytical Methods. Gerson/Halfpenny/Pizzini/Ristic/Roberts/Sheen/Sherwood: Application of Synchrotron X-Radiation to Problems in Materials Science. Jenkins: X-Ray Fluorescence Analysis. Williams: Polymer Molecular Structure Determination.

From the Back Cover

Materials Science and Technology A Comprehensive Treatment Edited by R.W. Cahn, P. Haasen, E.J. Kramer The 18 volume series "Materials Science and Technology" is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2A: This is the first of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers and ceramics. Topics included are: electron diffraction and transmission electron microscopy • analytical electron microscopy • scanning electron microscopy • X-ray diffraction • light optical microscopy • atomic spectroscopy • thermoanalytical methods • application of synchrotron X-radiation to problems in materials science • X-ray fluorescence analysis • polymer molecular structure determination.