A Collection of Test Problems for Constrained Global Optimization Algorithms

Panos M. Pardalos

ISBN 10: 3540530320 / ISBN 13: 9783540530329

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Sep 1990, 1990

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -Significant research activity has occurred in the area of global optimization in recent years. Many new theoretical, algorithmic, and computational contributions have resulted. Despite the major importance of test problems for researchers, there has been a lack of representative nonconvex test problems for constrained global optimization algorithms. This book is motivated by the scarcity of global optimization test problems and represents the first systematic collection of test problems for evaluating and testing constrained global optimization algorithms. This collection includes problems arising in a variety of engineering applications, and test problems from published computational reports.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 200 pp. Englisch.

Seller Inventory # 9783540530329

Bibliographic Details

• Title: A Collection of Test Problems for Constrained Global Optimization Algorithms
• Publisher: Springer Berlin Heidelberg, Springer Berlin Heidelberg Sep 1990
• Publication Date: 1990
• Language: English
• ISBN 10: 3540530320
• ISBN 13: 9783540530329
• Binding: Taschenbuch
• Condition: Neu

About this title

Synopsis

Significant research activity has occurred in the area of global optimization in recent years. Many new theoretical, algorithmic, and computational contributions have resulted. Despite the major importance of test problems for researchers, there has been a lack of representative nonconvex test problems for constrained global optimization algorithms. This book is motivated by the scarcity of global optimization test problems and represents the first systematic collection of test problems for evaluating and testing constrained global optimization algorithms. This collection includes problems arising in a variety of engineering applications, and test problems from published computational reports.