Computational Methods and Experimental Measurements XX
S. Hernandez (editor)
Sold by PBShop.store US, Wood Dale, IL, U.S.A.
AbeBooks Seller since April 7, 2005
New - Hardcover
Condition: New
Quantity: Over 20 available
Add to basketSold by PBShop.store US, Wood Dale, IL, U.S.A.
AbeBooks Seller since April 7, 2005
Condition: New
Quantity: Over 20 available
Add to basketNew Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Seller Inventory # L1-9781784664251
Formed of papers presented at the 20th International Conference on Computational Methods and Experimental Measurements, this volume provides a view of the latest work on the interaction between computational methods and experiments.
The continuous improvement in computer efficiency, coupled with diminishing costs and the rapid development of numerical procedures have generated an ever-increasing expansion of computational simulations that permeate all fields of science and technology. As these procedures continue to grow in magnitude and complexity, it is essential to validate their results to be certain of their reliability. This can be achieved by performing dedicated and accurate experiments, which have undergone constant and enormous development. At the same time, current experimental techniques have become more complex and sophisticated so that they require the intensive use of computers, both for running experiments as well as acquiring and processing the resulting data.
Some of the subject areas covered are: Fluid flow studies and experiments; Structural and stress analysis; Materials characterization; Electromagnetic problems; Structural integrity; Destructive and non-destructive testing; Heat transfer and thermal processes; Advances in computational methods; Automotive applications; Aerospace applications; Ocean engineering and marine structures; Fluid structure interaction; Bio-electromagnetics; Process simulations; Environmental monitoring, modelling and applications; Validation of computer modelling; Data and signal processing; Virtual testing and verification; Electromagnetic compatibility; Life cycle assessment.
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