Computer Analysis of Images and Patterns: 14th International Conference, Caip 2011, Seville, Spain, August 29-31, 2011, Proceedings, Part II

Berciano, Ainhoa (Editor)/ Diaz-pernil, Daniel (Editor)/ Kropatsch, Walter (Editor)/ Molina-abril, Helena (Editor)/ Real, Pedro (Editor)

ISBN 10: 3642236774 ISBN 13: 9783642236778
Published by Springer-Verlag New York Inc, 2011
Language: English
Condition: New Soft cover

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