Computer Vision for Electronics Manufacturing

L.F Pau

ISBN 10: 0306431823 / ISBN 13: 9780306431821

Published by Springer, 1990

About this Item

: Este libro explora la aplicación de la visión artificial en la fabricación de productos electrónicos. Aborda la inspección automatizada, el control de calidad y la optimización de procesos en la industria electrónica. El autor, L.F. Pau, ofrece una visión detallada de las técnicas y tecnologías utilizadas en este campo, incluyendo el procesamiento de imágenes, el reconocimiento de patrones y la inteligencia artificial. El libro es una valiosa fuente de información para ingenieros, investigadores y profesionales interesados en la automatización y la mejora de la eficiencia en la fabricación electrónica. EAN: 9780306431821 Tipo: Libros Categoría: Tecnología|Ciencias Título: Computer Vision for Electronics Manufacturing Autor: L.F Pau Editorial: Plenum Press Idioma: en Páginas: 324 Formato: tapa dura.

Seller Inventory # Happ-2026-02-12-693ed51d

Bibliographic Details

• Title: Computer Vision for Electronics Manufacturing
• Publisher: Springer
• Publication Date: 1990
• Language: English
• ISBN 10: 0306431823
• ISBN 13: 9780306431821
• Binding: Hardcover
• Condition: Aceptable

About this title

Synopsis

DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep­ tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure­ ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en­ gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac­ tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina­ tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.