From Contamination to Defects, Faults and Yield Loss

Language: English

Published by Springer US, 1996

0792397142 / 9780792397144

Series: Book 28 of 40 - Frontiers in Electronic Testing

  • Hardcover
  • New
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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this gre.

Seller Inventory # 5971681

Title
From Contamination to Defects, Faults and Yield Loss
Author
Jitendra B. Khare|Wojciech Maly
Publisher
Springer US
Publication year
1996
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0792397142
ISBN 13
9780792397144
Series
Book 28 of 40: Frontiers in Electronic Testing

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 56.58US$ 56.58
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Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268