From Contamination to Defects, Faults and Yield Loss

Language: English

Published by Springer US Apr 1996, 1996

0792397142 / 9780792397144

Series: Book 28 of 40 - Frontiers in Electronic Testing

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing. 172 pp. Englisch.

Seller Inventory # 9780792397144

Title
From Contamination to Defects, Faults and Yield Loss
Author
Wojciech Maly
Publisher
Springer US Apr 1996
Publication year
1996
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0792397142
ISBN 13
9780792397144
Item weight
430 grams
Dimensions
241x160x16 mm
Series
Book 28 of 40: Frontiers in Electronic Testing

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 26.56US$ 26.56
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BuchWeltWeit Ludwig Meier e.K.

Germany