DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS

Sachdev

ISBN 10: 8184894295 / ISBN 13: 9788184894295

Published by New Age International Publisher, 2010

About this Item

Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.

Seller Inventory # ABBB-15941

Bibliographic Details

• Title: DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
• Publisher: New Age International Publisher
• Publication Date: 2010
• Language: English
• ISBN 10: 8184894295
• ISBN 13: 9788184894295
• Binding: Soft cover
• Edition: International Edition
• Condition: New

About this title

Synopsis

The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.