Data Quality | The Accuracy Dimension

Jack L. Olson

ISBN 10: 1558608915 / ISBN 13: 9781558608917

Published by Elsevier Inc, 2003

About this Item

Data Quality | The Accuracy Dimension | Jack L. Olson | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2003 | Elsevier Inc | EAN 9781558608917 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.

Seller Inventory # 126687567

Bibliographic Details

• Title: Data Quality | The Accuracy Dimension
• Publisher: Elsevier Inc
• Publication Date: 2003
• Language: English
• ISBN 10: 1558608915
• ISBN 13: 9781558608917
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 227W x 161H x 16D millimeters 227 millimeters width by 161 millimeters height by 16 millimeters depth
• Weight: 422 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

Data Quality: The Accuracy Dimension is about assessing the quality of corporate data and improving its accuracy using the data profiling method. Corporate data is increasingly important as companies continue to find new ways to use it. Likewise, improving the accuracy of data in information systems is fast becoming a major goal as companies realize how much it affects their bottom line. Data profiling is a new technology that supports and enhances the accuracy of databases throughout major IT shops. Jack Olson explains data profiling and shows how it fits into the larger picture of data quality.

* Provides an accessible, enjoyable introduction to the subject of data accuracy, peppered with real-world anecdotes. * Provides a framework for data profiling with a discussion of analytical tools appropriate for assessing data accuracy. * Is written by one of the original developers of data profiling technology. * Is a must-read for any data management staff, IT management staff, and CIOs of companies with data assets.

About the Author

Jack E. Olson is a widely recognized database technology expert. His career includes significant contributions at IBM, BMC, Evoke, and now NEON Enterprise Software, where he serves as Chief Technology Office. Olson is author of Data Quality: The Accuracy Dimension, also published by Morgan Kaufmann. The inventor of record on several patents, he holds a BS from the Illinois Institute of Technology and an MBA from Northwestern University.