Deep Learning for Advanced X-ray Detection and Imaging Applications

Language: English

Published by Springer, Berlin, Springer Nature Switzerland, Springer, 2025

3031756525 / 9783031756528

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging. 261 pp. Englisch.

Seller Inventory # 9783031756528

Title
Deep Learning for Advanced X-ray Detection and Imaging Applications
Author
Krzysztof (Kris) Iniewski
Publisher
Springer, Berlin, Springer Nature Switzerland, Springer
Publication year
2025
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3031756525
ISBN 13
9783031756528
Item weight
520 grams
Dimensions
235x155x18 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 26.37US$ 26.37
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BuchWeltWeit Ludwig Meier e.K.

Germany