Deep Learning for Sustainable Agriculture (Cognitive Data Science in Sustainable Computing)
Sold by Books Puddle, New York, NY, U.S.A.
AbeBooks Seller since November 22, 2018
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Add to basketSold by Books Puddle, New York, NY, U.S.A.
AbeBooks Seller since November 22, 2018
Condition: New
Quantity: 3 available
Add to basket1st edition NO-PA16APR2015-KAP.
Seller Inventory # 26386979203
The evolution of deep learning models, combined with with advances in the Internet of Things and sensor technology, has gained more importance for weather forecasting, plant disease detection, underground water detection, soil quality, crop condition monitoring, and many other issues in the field of agriculture. agriculture. Deep Learning for Sustainable Agriculture discusses topics such as the impactful role of deep learning during the analysis of sustainable agriculture data and how deep learning can help farmers make better decisions. It also considers the latest deep learning techniques for effective agriculture data management, as well as the standards established by international organizations in related fields. The book provides advanced students and professionals in agricultural science and engineering, geography, and geospatial technology science with an in-depth explanation of the relationship between agricultural inference and the decision-support amenities offered by an advanced mathematical evolutionary algorithm.
Dr. Soumya Ranjan Nayak now holds the position of Assistant Professor in the School of Computer Engineering at Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, located in Odisha, India. He obtained a Doctor of Philosophy (Ph.D) and Master of Technology (M.Tech) in Computer Science and Engineering under a scholarship provided by the Ministry of Human Resource Development (MHRD) of the Government of India. These degrees were earned at CET, BPUT Rourkela, India. Prior to this, he completed a Bachelor of Technology (B. Tech) and a Diploma in Computer Science and Engineering. He has authored over 150 articles that have been published in reputable international journals and conferences such as Elsevier, Springer, World Scientific, IOS Press, Taylor & Francis, Hindawi, Inderscience, IGI Global, and others. These publications have undergone a rigorous peer-review process. In addition to the aforementioned accomplishments, the individual has authored 16 book chapters, published 6 books, and obtained 7 Indian patents (with 4 patents being granted). Furthermore, they have secured 4 International patents, all of which have been granted. The researcher's current areas of focus encompass medical picture analysis and classification, machine learning, deep learning, pattern recognition, fractal graphics, and computer vision. The author's writings have garnered over 1500 citations, with an h-index of 24 and an i10-index of 63, as reported by Google Scholar. Dr. Nayak holds the position of an associate editor for several esteemed academic journals, including the Journal of Electronic Imaging (SPIE), Mathematical Problems in Engineering (Hindawi), Journal of Biomedical Imaging (Hindawi), Applied Computational Intelligence and Soft Computing (Hindawi), and PLOS One. He is currently fulfilling the role of a guest editor for special issues of renowned academic journals such as Springer Nature, Elsevier, and Taylor & Franchise. He has been affiliated as a reviewer for numerous esteemed peer-reviewed journals, including Applied Mathematics and Computation, Journal of Applied Remote Sensing, Mathematical Problems in Engineering, International Journal of Light and Electron Optics, Journal of Intelligent and Fuzzy Systems, Future Generation Computer Systems, Pattern Recognition Letters, and others. He has additionally held the Technical Program Committee Member position for several conferences of significant worldwide recognition.
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