Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors The Yokohama 21st Century Forum Yokohama, Japan, September 17-22, 1989 (2 vols.set/ 2 Bände KOMPLETT)

Sumino, K.:

ISBN 10: 0444884297 / ISBN 13: 9780444884299

Published by Elsevier Science Ltd.;, 1990

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1746 Seiten; durchgehende Zählung; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. In ENGLISCHER Sprache. KOMPLETTPREIS für 2 Bände; bei Versand außerhalb der EU erfragen Sie bitte zuerst die Versandkosten; Sprache: Englisch Gewicht in Gramm: 4600.

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Bibliographic Details

• Title: Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors The Yokohama 21st Century Forum Yokohama, Japan, September 17-22, 1989 (2 vols.set/ 2 Bände KOMPLETT)
• Publisher: Elsevier Science Ltd.
• Publication Date: 1990
• Language: English
• ISBN 10: 0444884297
• ISBN 13: 9780444884299
• Binding: gebundene Ausgabe
• Condition: Gut
• Weight: 4600 grams
• Seller catalogs:
  • 201 Physik

About this title

Synopsis

Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.