Defect and Fault Tolerance in VLSI Systems

Language: English

Published by Springer, Humana Mai 2013, 2013

1475799594 / 9781475799590

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This item is printed on demand - Print on Demand Titel. Neuware -Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 332 pp. Englisch.

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Title
Defect and Fault Tolerance in VLSI Systems
Author
C. H. Stapper
Publisher
Springer, Humana Mai 2013
Publication year
2013
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1475799594
ISBN 13
9781475799590
Item weight
626 grams
Dimensions
254x178x19 mm

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