Defect and Impurity Engineered Semiconductors and Devices: Volume 378: Symposium Held April 17-21, 1995, San Francisco, California, U.S.A (MRS Proceedings)

Edited by I. Akasaki , S. Ashok , J. Chevallier , N. M. Johnson , B. L. Sopori

ISBN 10: 1558992812 / ISBN 13: 9781558992818

Published by Materials Research Society, 1995

About this Item

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Akasaki, I. (Meijo University, Japan); Ashok, S.; Chevallier, J.; Johnson, N. M.; Sopori, B. L. Series: MRS Proceedings. Num Pages: 1082 pages, black & white illustrations. BIC Classification: TGM; TJFD5. Category: (U) Tertiary Education (US: College). Dimension: 229 x 152 x 56. Weight in Grams: 1600. . 1995. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.

Seller Inventory # V9781558992818

Bibliographic Details

• Title: Defect and Impurity Engineered Semiconductors and Devices: Volume 378: Symposium Held April 17-21, 1995, San Francisco, California, U.S.A (MRS Proceedings)
• Publisher: Materials Research Society
• Publication Date: 1995
• Language: English
• ISBN 10: 1558992812
• ISBN 13: 9781558992818
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities. Papers are grouped around ten distinct topics covering materials, processing and devices. Topics include: grown-in defects in bulk crystals; grown-in defects in thin films; gettering and related phenomena; hydrogen interaction with semiconductors; defect issues in widegap semiconductors; defect characterization; ion implantation and process-induced defects; defects in devices; interfaces, quantum wells and superlattices; and defect properties, reaction, activation and passivation.

Book Description

Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities.