Defect and Microstructure Analysis by Diffraction

Fiala, Jaroslav, Snyder, Robert L., Bunge, Hans J.

ISBN 10: 0198501897 ISBN 13: 9780198501893
Published by International Union of Crystallography, 2000
Language: English
Condition: Good Hardcover

From Better World Books Ltd, Dunfermline, United Kingdom

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