ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.

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Bibliographic Details

Title: Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
Publisher: Springer India
Publication Date: 2021
Language: English
ISBN 10: 8184894295
ISBN 13: 9788184894295
Binding: Soft cover
Condition: New

About this title

Synopsis

The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

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