Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, . 1997 (Institute of Physics Conference)

J. Doneker, I. Rechenberg

ISBN 10: 0750305002 / ISBN 13: 9780750305006

Published by CRC Press 1998-01-01, 1998

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Seller Inventory # 6666-TNFPD-9780750305006

Bibliographic Details

Title: Defect Recognition and Image Processing in ...

Publisher: CRC Press 1998-01-01

Publication Date: 1998

Binding: Hardcover

Condition: New

About this title

Synopsis:

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Review:

listed in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database. in SPIE-OE Reports No 174, 1998 listed in Scitech Book News, September 1998 Abstracted in INSPEC Database.