Defects in SiO2 and Related Dielectrics: Science and Technology

Gianfranco Pacchioni

ISBN 10: 0792366867 / ISBN 13: 9780792366867

Published by Springer Netherlands, Springer, 2000

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Seller Inventory # 9780792366867

Bibliographic Details

• Title: Defects in SiO2 and Related Dielectrics: Science and Technology
• Publisher: Springer Netherlands, Springer
• Publication Date: 2000
• Language: English
• ISBN 10: 0792366867
• ISBN 13: 9780792366867
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 34D millimeters 235 millimeters width by 155 millimeters height by 34 millimeters depth
• Weight: 949 grams

About this title

Synopsis

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.