Defects in SiO2 and Related Dielectrics: Science and Technology

Language: English

Published by Springer Netherlands Dez 2000, 2000

0792366867 / 9780792366867

Series: Book 4 of 241 - NATO Science Series II: Mathematics, Physics and Chemistry

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Softcover

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This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. 636 pp. Englisch.

Seller Inventory # 9780792366867

Title
Defects in SiO2 and Related Dielectrics: Science and Technology
Author
Gianfranco Pacchioni
Publisher
Springer Netherlands Dez 2000
Publication year
2000
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
0792366867
ISBN 13
9780792366867
Item weight
949 grams
Dimensions
235x155x34 mm
Series
Book 4 of 241: NATO Science Series II: Mathematics, Physics and Chemistry

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany