Defects in SiO2 and Related Dielectrics: Science and Technology

Gianfranco Pacchioni

ISBN 10: 0792366859 / ISBN 13: 9780792366850

Published by Springer Netherlands Dez 2000, 2000

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. 636 pp. Englisch.

Seller Inventory # 9780792366850

Bibliographic Details

• Title: Defects in SiO2 and Related Dielectrics: Science and Technology
• Publisher: Springer Netherlands Dez 2000
• Publication Date: 2000
• Language: English
• ISBN 10: 0792366859
• ISBN 13: 9780792366850
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 39D millimeters 241 millimeters width by 160 millimeters height by 39 millimeters depth
• Weight: 1109 grams

About this title

Synopsis

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.