Defects Spectroscopy in Silicon Diodes | Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

Nicolò Barbero

ISBN 10: 3639773047 / ISBN 13: 9783639773040

Published by Edizioni Accademiche Italiane, 2015

About this Item

Defects Spectroscopy in Silicon Diodes | Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage | Nicolò Barbero | Taschenbuch | 244 S. | Englisch | 2015 | Edizioni Accademiche Italiane | EAN 9783639773040 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Seller Inventory # 104092429

Bibliographic Details

• Title: Defects Spectroscopy in Silicon Diodes | Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage
• Publisher: Edizioni Accademiche Italiane
• Publication Date: 2015
• Language: English
• ISBN 10: 3639773047
• ISBN 13: 9783639773040
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 16D millimeters 220 millimeters width by 150 millimeters height by 16 millimeters depth
• Weight: 381 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book focuses on two aspects of deep-level traps in semiconductor devices: on one hand the platinum impurities are studied as example of defects diffused purposefully in pin power ultra-fast diodes in order to increase their recovery performance; on the other hand, the ionizing radiation-induced defects are considered. In this case, some academic samples are studied before and after irradiation with a 3 MeV proton beam. The devices are studied by means of IV, CV, CVT and DLTS techniques. This study deals with the characterization and dynamics of the defects, starting from the realization ab initio of new defects-spectroscopy setups. It is a research performed within the "IAEA Coordinated Project on Utilization of Ion Accelerators for Studying and Modelling Ion Induced Radiation Defects in Semiconductors and Insulators" (2012-2015).

About the Author

I received the M.Sc. degree in Condensed matter Physics at the University of Torino focusing on Semiconductor Physics and radiation-induced damage on electronics devices. Currently I am continuing my research as doctoral student at ETH Zurich. My current topics are magnetism in strongly-correlated systems and the study of complexity.