Delay Fault Testing for VLSI Circuits

Language: English

Published by Springer, Springer, 2012

1461375614 / 9781461375616

Series: Book 31 of 40 - Frontiers in Electronic Testing

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Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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Druck auf Anfrage Neuware - Printed after ordering - In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Seller Inventory # 9781461375616

Title
Delay Fault Testing for VLSI Circuits
Author
Angela Krstic
Publisher
Springer, Springer
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1461375614
ISBN 13
9781461375616
Item weight
324 grams
Dimensions
235x155x12 mm
Series
Book 31 of 40: Frontiers in Electronic Testing

AHA-BUCH GmbH

Einbeck, Germany

5-star seller

AbeBooks seller since August 14, 2006

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