Denoising in digital speckle pattern interferometry by Riesz wavelets

Language: English

Published by LAP LAMBERT Academic Publishing Jul 2018, 2018

6139873827 / 9786139873821

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain. 56 pp. Englisch.

Seller Inventory # 9786139873821

Title
Denoising in digital speckle pattern interferometry by Riesz wavelets
Author
Abdelkrim Nassim
Publisher
LAP LAMBERT Academic Publishing Jul 2018
Publication year
2018
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
6139873827
ISBN 13
9786139873821
Item weight
102 grams
Dimensions
220x150x4 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

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