Denoising in digital speckle pattern interferometry by Riesz wavelets

Nassim, Abdelkrim/ Tounsi, Yassine/ Siari, Ahmed

ISBN 10: 6139873827 / ISBN 13: 9786139873821

Published by LAP LAMBERT Academic Publishing, 2018

About this Item

56 pages. 8.66x5.91x0.13 inches. In Stock.

Seller Inventory # zk6139873827

Bibliographic Details

• Title: Denoising in digital speckle pattern interferometry by Riesz wavelets
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2018
• Language: English
• ISBN 10: 6139873827
• ISBN 13: 9786139873821
• Binding: Paperback
• Condition: Brand New
• Weight: 0.13 kilograms

About this title

Synopsis

Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain.