Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)

ISBN 10: 0792386698 / ISBN 13: 9780792386698

Published by Springer, 1999

About this Item

Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.

Seller Inventory # GWSVV.0792386698.A

Bibliographic Details

• Title: Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
• Publisher: Springer
• Publication Date: 1999
• Language: English
• ISBN 10: 0792386698
• ISBN 13: 9780792386698
• Binding: Hardcover
• Condition: acceptable

About this title

Synopsis

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.