Design for Manufacturability and Yield for Nano-Scale CMOS

Language: English

Published by Springer Netherlands, 2007

1402051875 / 9781402051876

Series: Book 5 of 34 - Integrated Circuits and Systems

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Addressing a new topic (DFM/DFY) critical at 90 nm and beyondNo book available today with comprehensive coverage of this topicBook covers all CAD/CAE aspects of a SOC design flowDr. Charles Chiang is R&ampD Director of the Advanced.

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Title
Design for Manufacturability and Yield for Nano-Scale CMOS
Author
Charles Chiang|Jamil Kawa
Publisher
Springer Netherlands
Publication year
2007
Condition
New
Binding
Hardcover
Language
English
ISBN 10
1402051875
ISBN 13
9781402051876
Series
Book 5 of 34: Integrated Circuits and Systems

moluna

Greven, Germany

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AbeBooks seller since July 9, 2020

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