Design for Manufacturability and Yield for Nano-Scale CMOS

Language: English

Published by Springer Netherlands Nov 2010, 2010

9048173035 / 9789048173037

Series: Book 5 of 34 - Integrated Circuits and Systems

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Condition: New

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Item description from seller

This item is printed on demand - it takes 3-4 days longer - Neuware -This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development. 288 pp. Englisch.

Seller Inventory # 9789048173037

Title
Design for Manufacturability and Yield for Nano-Scale CMOS
Author
Jamil Kawa
Publisher
Springer Netherlands Nov 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
9048173035
ISBN 13
9789048173037
Item weight
441 grams
Dimensions
235x155x16 mm
Series
Book 5 of 34: Integrated Circuits and Systems

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 26.81US$ 26.81
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BuchWeltWeit Ludwig Meier e.K.

Germany